Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits - Bushnell, Michael L.; Agrawal, Vishwani D. (Boston, MA. : Kluwer Academic Pub., 2000)
Includes bibliographical references and index.
Keywords: Digital integrated circuits -- -- Testing; Integrated circuits -- -- Very large scale integration -- -- Testing; Mixed signal circuits -- -- Testing; Semiconductor storage devices -- -- Testing